Nanoscale IR imaging by combining AFM and optical methodology
نویسنده
چکیده
This review outlines an emerging nano-imaging method referred to as Atomic Force Microscopy Infrared Microscopy that enables IR imaging with lateral nanoscale resolution based on combining AFM and optical methodologies. Atomic Force Microscopy Infrared Microscopy enables imaging with nanoscale resolution and enables simultaneously AFM topography imaging. This review outlines the methodology and its application in imaging both biological and functional materials, including an outline of where this emerging method has been applied to image cellular systems in aqueous environments opening up the way for live cell imaging.
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تاریخ انتشار 2017